IMS 2012 Microapps - Practical Techniques for Recognizing and Diagnosing Root Causes of Poor Waferlevel S-parameter Calibrations

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  • #2012
  • #IMS
  • #MicroApps
  • #Practical Techniques for Recognizing and Diagnosing Root Causes of poor Waferlevel Sparameter Calibrations
  • #Craig Kirkpatrick

IMS 2012 MicroApps presents "Practical Techniques for Recognizing and Diagnosing Root Causes of Poor Waferlevel S-parameter Calibrations," by  Craig Kirkpatrick of Cascade Microtech.

  • Published on
  • July 6, 2012

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