Micro-Apps 2013: Determining Circuit Material Dielectric Constant from Phase Measurements

Determining Circuit Material Dielectric Constant from Phase Measurements

John Coonrod, Rogers Corporation

There are numerous methods for determining the dielectric constant (Dk) of a high frequency circuit material. It has been found that the best method is to use a procedure which mimics the application in which the material will be used. Rogers Corporation has evaluated many test procedures for determining the dielectric constant of a circuit material. One method which is used for the “Design Dk” is the microstrip differential phase length method. Microstrip structures are very commonly used in the industry and this method employs transmission lines of different lengths, when made on the same panel of material. The transmission line circuits are measured for phase and a software is used to determine the dielectric constant of the material. This presentation will give an overview of the microstrip differential phase length testing procedure. Results will be shown as well as how to use the free software.

IMS2013 Micro-Apps Tuesday 1530