Microwave Journal Panel Session Path to 5G - Design and Test Challenges - MicroApps IMS 2015

  • 504 views


  • Download
  • Share
    Conference Highlights

Microwave Journal Panel Session Path to 5G
Design and Test Challenges

Moderated by Eric Higham, Strategy Analytics

This lively discussion features Rogers Nichols, Keysight Technologies, Inc.; Jin Bains, National Instruments; Andreas Roessler, Rohde & Schwarz, Inc.; Mark Cloutier, Analog Devices, Inc.; David Ryan, MACOM, Inc.

Organizer Pat Hindle, Microwave Journal

  • Published on
  • June 18, 2015

Avatar

Biography

Videos with