IMS MicroApp: Causality Considerations for Multi-Gigabit StatEye Analysis

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#Mike Heimlich #AWR Corp. #Ted Mido #Scott Wedge #Synopsys #Causality Considerations for MultiGigabit StatEye #IMS

IEEE.tv showcases the IEEE MTT International Microwave Symposium (IMS), held in Anaheim, California, May 23-28, 2010, the premier annual international meeting for technologists involved in all aspects of microwave theory and practice. It consists of a full week of events, including technical paper presentations, workshops, and tutorials, as well as a full set of social events. The symposium also hosts a huge commercial exhibition, organized by MP Associates.

Mike Heimlich, AWR Corp., Ted Mido and Scott Wedge, Synopsys present "Causality Considerations for Multi-Gigabit StatEye Analysis." As part of IMS 2010, MicroApps seminars from vendors of products and services in the microwave indus?try help microwave practitioners in learning the latest techniques, skills, and methods.

Mike Heimlich, AWR Corp., Ted Mido and Scott Wedge, Synopsys present "Causality Considerations for Multi-Gigabit StatEye Analysis." As part of IMS 2010, MicroApps seminars from vendors of products and services in the microwave industry help microwave practitioners in learning the latest techniques, skills, and methods.

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