IMS 2012 Microapps - Strengths and Limitations of the SOLR Wafer Level S-Parameter Calibration Technique

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  • #2012
  • #IMS
  • #MicroApps
  • #Strengths and Limitation of the SOLR Wafer Level SParameter Calibration Technique
  • #Craig Kirkpatrick

IMS 2012 MicroApps presents "Strengths and Limitations of the SOLR Wafer Level S-Parameter Calibration Technique," by Craig Kirkpatrick of Cascade Microtech and IMS2013 MicroApps Chair.

  • Published on
  • July 6, 2012

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