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Quality and Reliability Assessment of Sintered Nanoporous-Copper Interconnects on Substrates

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#reliability #photonics #electronics #advanced packaging #heterogeneous integration

(32:35 + Q&A) - Ramon Sosa, Prof. Vanessa Smet, Georgia Tech

For videos/slides from other talks at the Symposium on Reliability of Electronics and Photonics Packaging (REPP'22), please visit our website and join our IEEE Dlist:  attend.ieee.org/repp

(32:35 + Q&A) - Ramon Sosa, Prof. Vanessa Smet, Georgia Tech

For videos/slides from other talks at the Symposium on Reliability of Electronics and Photonics Packaging (REPP'22), please visit our website and join our IEEE Dlist:  attend.ieee.org/repp

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