On the Characterization of Thermal Coupling Resistance in a Current Mirror: RFIC Industry Showcase 2016

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    IEEE.tv is made possible by the Members of IEEE.

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On the Characterization of Thermal Coupling Resistance in a Current Mirror

Authors: Tianbing Chen, Bhuvaneshwaran Vijayakumar, Tzung-Yin Lee, Chun-Wen Paul Huang, Mike McPartlin

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  • Published on
  • July 13, 2016

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