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Microwave Journal Panel Session Path to 5G - Design and Test Challenges - MicroApps IMS 2015

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Microwave Journal Panel Session Path to 5G
Design and Test Challenges

Moderated by Eric Higham, Strategy Analytics

This lively discussion features Rogers Nichols, Keysight Technologies, Inc.; Jin Bains, National Instruments; Andreas Roessler, Rohde & Schwarz, Inc.; Mark Cloutier, Analog Devices, Inc.; David Ryan, MACOM, Inc.

Organizer Pat Hindle, Microwave Journal

Microwave Journal Panel Session Path to 5G
Design and Test Challenges

Moderated by Eric Higham, Strategy Analytics

This lively discussion features Rogers Nichols, Keysight Technologies, Inc.; Jin Bains, National Instruments; Andreas Roessler, Rohde & Schwarz, Inc.; Mark Cloutier, Analog Devices, Inc.; David Ryan, MACOM, Inc.

Organizer Pat Hindle, Microwave Journal

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