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4. Metric Learning With Background Noise Class For Few-Shot Detection Of Rare Sound Events

Metric Learning With Background Noise Class For Few-Shot Detection Of Rare Sound Events

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IEEE ICASSP 2020 Virtual Conference May 2020

Few-shot learning systems for sound event recognition have gained interests since they require only a few examples to adapt to new target classes without fine-tuning. However, such systems have only been applied to chunks of sounds for classification or v

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Metric Learning With Background Noise Class For Few-Shot Detection Of Rare Sound Events

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Few-shot learning systems for sound event recognition have gained interests since they require only a few examples to adapt to new target classes without fine-tuning. However, such systems have only been applied to chunks of sounds for classification or v