1. Home
2. Premium
3. IEEE ICASSP 2020 Virtual Conference May 2020
4. Exploration Methodology For Bti-Induced Failures On Rram-Based Edge Ai Systems

Exploration Methodology For Bti-Induced Failures On Rram-Based Edge Ai Systems

Collection:

IEEE ICASSP 2020 Virtual Conference May 2020

While resistive switching memory technologies (RRAM) are seen by most of the scientific community as an enabler for Edge-level applications such as embedded deep Learning, AI or signal processing of audio and video signals, going beyond a ``simple'' repla

• IEEE MemberUS $11.00
• Society MemberUS $0.00
• IEEE Student MemberUS $11.00
• Non-IEEE MemberUS $15.00

Purchase

Videos in this product

Exploration Methodology For Bti-Induced Failures On Rram-Based Edge Ai Systems

00:15:41

0 views

While resistive switching memory technologies (RRAM) are seen by most of the scientific community as an enabler for Edge-level applications such as embedded deep Learning, AI or signal processing of audio and video signals, going beyond a ``simple'' repla