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TCAD Investigation of Gate Lag Measurements on Conventional and π Gate AlGaN/GaN HEMTs 13 views Download Download IEEE.tv is made possible by the Members of IEEE. This feature is accessible to IEEE Members only, with an IEEE Account. If you are an IEEE Member please sign in to enable this feature. In addition to exclusive access to IEEE.tv programming, IEEE members have file download, and can save favorite videos with myTV. Discover all the benefits of IEEE membership! Belong to the world's largest technical proffecional society Join / Renew Today Share Embed Static Responsive <iframe src="//ieeetv.ieee.org/player/embed_play/178881/auto" allowfullscreen frameborder="0" scrolling="no" width="100%"></iframe> Size: x <iframe src="//ieeetv.ieee.org/player/embed_play/178881/auto" allowfullscreen frameborder="0" scrolling="no" width="760" height="430" ></iframe> Copy Close November 19, 2020
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