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Panel Session: 5G Test and Measurements - 5G Summit at IMS 2017

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MTT-S (IMS)
IEEE Communications Society
Brooklyn 5G Summit
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In this panel session, moderator Kate Remley (NIST) is joined by Malcolm Robertson (Keysight), Jason White (National Instruments), Chris Scholz (Rohde Schwartz) and Jon Martens (Anritsu) to discuss "5G Tests and Measurements." Recorded at the 5G Summit at the 2017 International Microwave Symposium (IMS).

 

In this panel session, moderator Kate Remley (NIST) is joined by Malcolm Robertson (Keysight), Jason White (National Instruments), Chris Scholz (Rohde Schwartz) and Jon Martens (Anritsu) to discuss "5G Tests and Measurements." Recorded at the 5G Summit at the 2017 International Microwave Symposium (IMS).

 

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