From Human Eye for AR and back to Semiconductor for Human Eye

(32:36) Dr. Will (Wei) Zhou, CTO, MLOptic Corp. — Dr. Zhou will present ML’s key milestones in precision optical metrology, highlighting the journey from mimicking the human eye for AR metrology, to exploring the micron scale in semiconductor inspection, and now advancing toward medical devices for human eye diagnostics. 
Bio: Dr. Wei (Will) Zhou is the CTO of MLoptic Corp, where he founded MLUSA and leads the company’s global R&D organization in delivering advanced optical metrology solutions for the consumer electronics, semiconductor, and autonomous industries. He holds over 50 patents and has authored numerous publications. Dr. Zhou also teaches SPIE short courses at Photonics West and Optics & Photonics conferences, and actively serves the SPIE community as a conference committee member and judge for society competitions. He built an international engineering team from the ground up, growing it in just three years to over 200 experts across the USA, China, Thailand, and the UK. Under his leadership, the team developed the first complete optical metrology platforms covering the entire AR/VR optical measurement chain, supporting the design and manufacturing of leading AR companies.
Previously, Dr. Zhou contributed to Microsoft’s first-generation HoloLens, leading mass-production optical metrology efforts, and at Rudolph Technologies, he developed multiple generations of semiconductor macro-defect inspection tools now deployed in fabs worldwide, including TSMC and Samsung.

Edited videos and slides from most of the REPP talks are available at https://attend.ieee.org/repp/?page_id=2110  
Join our Dlist to hear about future REPPs: https://attend.ieee.org/repp/?page_id=361 
Organized by the IEEE Silicon Valley chapter of the Electronics Packaging Society: https://ieee.org/scveps