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Panel: Silent Data Corruption (SDC) Testing Strategies for AI Hardware

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IEEE Electronics Packaging Society
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#REPP #electronics packaging #photonics packaging #silent data corruption #SDC #AI

(39:03)  Moderator Fen Chen (Nvidia); Panelists Harish Dixit (Meta); David Lerner (Intel); Amr Haggag (ARM); Jeffrey Ma (Harvard University) -- Presentations on various aspects of SDC, followed by a Q&A period with the panelists.

Speakers in this video

Paul Wesling

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