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00:02:34IEEE, Brighter Than Ever: Sections Congress 2017
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00:00:35Brilliant Minds, Bright Futures: IEEE Sections Congress 2017
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00:05:26Transphorm: GaN Champions
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00:00:20Lead Beyond: Women in Engineering International Leadership Conference 2014
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00:44:24IMS 2012 Tom Lee Keynote
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00:32:50IMS 2012 Steve Mollenkopf Plenary
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00:02:15IMS 2012 Highlights
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00:10:44IMS 2012 Microapps - Passive Intermodulation (PIM) measurement using vector network analyzer Osamu Kusano, Agilent CTD-Kobe
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00:13:15IMS 2012 Microapps - Generation and Analysis Techniques for Cost-efficient SATCOM Measurements Richard Overdorf, Agilent
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