1. Home
  2. Premium
  3. Test Methodology for Analysis of Coexistent Logic-Level Faults in NoC Channels
Test Methodology for Analysis of Coexistent Logic-Level Faults in NoC Channels

This video program is a part of the Premium package:

Test Methodology for Analysis of Coexistent Logic-Level Faults in NoC Channels

  • IEEE MemberUS $11.00
  • Society MemberUS $0.00
  • IEEE Student MemberUS $11.00
  • Non-IEEE MemberUS $15.00
Purchase

Test Methodology for Analysis of Coexistent Logic-Level Faults in NoC Channels

0 views
  • Share
Create Account or Sign In to post comments

Next Up

00:30:20
IEEE Standards Association – A New Era: Raising the World’s Standards
>
00:49:13
Entrepreneurship and Innovation in Robotics
>
00:08:06
Siwei Li - RFIC Student Showcase - IMS 2021
>
00:03:49
Gaofeng Jin - RFIC Student Showcase - IMS 2021
>
00:03:57
Shimin Huang - RFIC Student Showcase - IMS 2021
>
00:04:15
Xinyan Tang - RFIC Student Showcase - IMS 2021
>