Failure-Oriented-Accelerated-Tests (FOATs) and their Roles in Making a Viable IC Package into a Reliable Product
(25:38) - Dr. Ephraim Suhir, Portland State University
For videos/slides from other talks at the Symposium on Reliability of Electronics and Photonics Packaging (REPP'22), please visit our website and join our IEEE Dlist: attend.ieee.org/repp
(25:38) - Dr. Ephraim Suhir, Portland State University
For videos/slides from other talks at the Symposium on Reliability of Electronics and Photonics Packaging (REPP'22), please visit our website and join our IEEE Dlist: attend.ieee.org/repp